ESAIM: Mathematical Modelling and Numerical Analysis (ESAIM: M2AN)

Numerical study of the systematic error in Monte Carlo schemes for semiconductors

Orazio Muscato, Wolfgang Wagner and Vincenza Di Stefano

ESAIM: M2AN, 44 5 (2010) 1049-1068

Published online: 26 August 2010

DOI: 10.1051/m2an/2010051

Orazio Muscato

Wolfgang Wagner

Vincenza Di Stefano

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